This paper concerns diffraction-tomographic reconstruction of an object characterized by its scattering potential. We establish a rigorous generalization of the Fourier diffraction theorem in arbitrary dimension, giving a precise relation in the Fourier domain between measurements of the scattered wave and reconstructions of the scattering potential. With this theorem at hand, Fourier coverages for different experimental setups are investigated taking into account parameters such as object orientation, direction of incidence and frequency of illumination. Allowing for simultaneous and discontinuous variation of these parameters, a general filtered backpropagation formula is derived resulting in an explicit approximation of the scattering potential for a large class of experimental setups.
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