We study the performance of machine learning binary classification techniques in terms of error probabilities. The statistical test is based on the Data-Driven Decision Function (D3F), learned in the training phase, i.e., what is thresholded before the final binary decision is made. Based on large deviations theory, we show that under appropriate conditions the classification error probabilities vanish exponentially, as $\sim \exp\left(-n\,I + o(n) \right)$, where $I$ is the error rate and $n$ is the number of observations available for testing. We also propose two different approximations for the error probability curves, one based on a refined asymptotic formula (often referred to as exact asymptotics), and another one based on the central limit theorem. The theoretical findings are finally tested using the popular MNIST dataset.
翻译:我们从差错概率的角度研究机器学习二进制分类技术的性能。 统计测试基于在培训阶段学习的数据驱动决定函数( D3F), 即最终二进制决定之前的临界值。 根据大偏差理论, 我们显示在适当条件下, 分类错误概率会指数化消失, 因为$\sim\left( - n\, I + o( o)\right)$, 其中美元是误差率, 美元是可用于测试的观测数。 我们还提出了两种差错概率曲线的近似值, 一种是基于精细细的单进式公式( 通常称为精确的模拟公式 ), 另一种是基于核心参数。 理论结果最终通过流行的 MNIST 数据集测试 。