Accurately measuring the size, morphology, and structure of nanoparticles is very important, because they are strongly dependent on their properties for many applications. In this paper, we present a deep-learning based method for nanoparticle measurement and classification trained from a small data set of scanning transmission electron microscopy images. Our approach is comprised of two stages: localization, i.e., detection of nanoparticles, and classification, i.e., categorization of their ultrastructure. For each stage, we optimize the segmentation and classification by analysis of the different state-of-the-art neural networks. We show how the generation of synthetic images, either using image processing or using various image generation neural networks, can be used to improve the results in both stages. Finally, the application of the algorithm to bimetallic nanoparticles demonstrates the automated data collection of size distributions including classification of complex ultrastructures. The developed method can be easily transferred to other material systems and nanoparticle structures.
翻译:精确测量纳米粒子的大小、形态和结构非常重要,因为它们在许多应用中都非常依赖其特性。在本文中,我们展示了一种基于深学习的纳米粒子测量和分类方法,该方法从扫描传输电子显微镜图像的小型数据集中培训,我们的方法分为两个阶段:局部化,即纳米粒子的探测和分类,即其超结构的分类。在每一个阶段,我们通过分析不同的先进神经网络来优化分解和分类。我们展示了如何利用图像处理或使用各种图像生成神经网络来生成合成图像来改善两个阶段的结果。最后,对双金属纳米粒子的算法应用显示了大小分布的自动数据收集,包括复杂的超结构的分类。开发的方法可以很容易地转移到其他材料系统和纳米粒子结构。