微小物体光栅投影三维测量关键技术研究

项目名称： 微小物体光栅投影三维测量关键技术研究

项目编号： No.51475092

项目类型： 面上项目

立项/批准年度： 2015

项目学科： 机械、仪表工业

项目作者： 达飞鹏

作者单位： 东南大学

项目金额： 85万元

中文摘要： 光栅投影三维测量技术具有非接触、速度快、数据量大、精度较高等优点，是先进制造领域中最重要的光学三维测量方法之一。随着先进制造等应用领域的需求拓展和研究领域相关技术的快速发展，对光栅投影三维测量技术也提出了更高要求，如何实现微小尺寸物体光栅投影三维测量面临着挑战。申请人在国家自然科学基金资助下，对光栅投影三维精密测量的诸多关键技术进行了较为深入和持续的研究，并在理论研究基础上，自主开发了光栅投影三维精密测量原型系统。本项目拟在此基础上，以实现微小尺寸物体测量为目标，重点研究显微系统构建、小视场系统标定、非线性校正、高质量相位信息获取等关键问题，设计高分辨率光学显微系统，提出新的小视场系统标定、投影光栅模式校正、基于变换法的相位求解、彩色光栅投影以及三维数据配准等方法。基于此，实现微小尺寸物体(几十微米/几十毫米)光栅投影三维测量原型系统。

中文关键词： 三维测量；光栅投影；微小物体；系统标定；相位获取

英文摘要： Fringe projection 3D shape measurement technique is one of the most promising 3D optical metrologies in applications of advanced manufacturing, as its attributes of non-contact, high-speed, large 3D points, and high-accuracy. With the higher demand of practical applications and the rapid development of science and technology, there are some challeges for fringe projection 3D shape measurement, especially for the small size objects 3D shape measurement. Supported by the projects of the National Scince Foundation of China (NSFC), we have done lots of research work in improving the fringe projection performance index and a high-accuracy fringe projection 3D shape measuremet system has been self-developed. Based on the previous works, this project aims to realise 3D measurement for small size objects by fringe projection technique. The key factors include system construction, small field calibration, system nonlinearity correction and high-quality phase acquisition. Based on the proposed high-spatial resolution optical system for small size objects measurement, novel methods including small field calibration, system nonlinearity correction, transform-method based phase extraction, color fringe projection technique and 3D point matching should be proposed. Based on these theoretical research results, a fringe projection 3D shape measurement system for small size object is set up, whose measuring range is from tens of micrometers to tens of millimeters.

英文关键词： 3D shape measurement;Fringe projection;Small size object;System calibration;Phase extraction