One-Shot Device Testing Data Analysis under Logistic-Exponential Lifetimes with an Application to Murine model with Melioidosis Data

In the literature, the reliability analysis of one-shot devices is found under accelerated life testing in presence of various stress factors. The application of one-shot devices can be extended to the bio-medical field, where often we evidence the emergence of certain diseases under different stress factors due to environmental conditions, lifestyle aspects, presence of co-morbidity etc. In this work, one-shot device data analysis is performed in application to the Murine model for Melioidosis data. The two-parameter logistic exponential distribution is assumed as a lifetime distribution. Weighted minimum density power divergence estimators (WMDPDEs) for robust parameter estimation are obtained along with the conventional maximum likelihood estimators (MLEs). The asymptotic behaviour of the WMDPDEs and testing of the hypothesis based on it are also studied. The performances of estimators are evaluated through extensive simulation experiments. Later those developments are applied to the Murine model for Melioidosis Data. Citing the importance of knowing exactly when to inspect the one-shot devices put to test, a search for optimum inspection times is performed. This optimization is designed to minimize a defined cost function which strikes a trade-off between the precision of the estimation and experimental cost. The search is performed through the population-based heuristic optimization method Genetic Algorithm.