Recent approaches based on metric learning have achieved great progress in few-shot learning. However, most of them are limited to image-level representation manners, which fail to properly deal with the intra-class variations and spatial knowledge and thus produce undesirable performance. In this paper we propose a Deep Bias Rectify Network (DBRN) to fully exploit the spatial information that exists in the structure of the feature representations. We first employ a bias rectify module to alleviate the adverse impact caused by the intra-class variations. bias rectify module is able to focus on the features that are more discriminative for classification by given different weights. To make full use of the training data, we design a prototype augment mechanism that can make the prototypes generated from the support set to be more representative. To validate the effectiveness of our method, we conducted extensive experiments on various popular few-shot classification benchmarks and our methods can outperform state-of-the-art methods.
翻译:以计量学习为基础的近期方法在微小的学习中取得了巨大进展,但是,大多数方法都局限于图像层面的表述方式,无法适当处理阶级内部的变化和空间知识,从而产生不良的性能。在本文件中,我们提议建立一个深比亚斯校正网络(DBRN),以充分利用特征表达结构中存在的空间信息。我们首先使用偏差校正模块来减轻阶级内部差异造成的不良影响。偏差校正模块能够侧重于那些因不同因素而更具有歧视性的分类特征。为了充分利用培训数据,我们设计了一个原型增强机制,使从所设定的支持中生成的原型更具代表性。为了验证我们的方法的有效性,我们对各种流行的微小的分类基准进行了广泛的实验,我们的方法可以超越最先进的方法。