While overparameterization is known to benefit generalization, its impact on Out-Of-Distribution (OOD) detection is less understood. This paper investigates the influence of model complexity in OOD detection. We propose an expected OOD risk metric to evaluate classifiers confidence on both training and OOD samples. Leveraging Random Matrix Theory, we derive bounds for the expected OOD risk of binary least-squares classifiers applied to Gaussian data. We show that the OOD risk depicts an infinite peak, when the number of parameters is equal to the number of samples, which we associate with the double descent phenomenon. Our experimental study on different OOD detection methods across multiple neural architectures extends our theoretical insights and highlights a double descent curve. Our observations suggest that overparameterization does not necessarily lead to better OOD detection. Using the Neural Collapse framework, we provide insights to better understand this behavior. To facilitate reproducibility, our code will be made publicly available upon publication.
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