An Enhanced Span-based Decomposition Method for Few-Shot Sequence Labeling

Few-Shot Sequence Labeling (FSSL) is a canonical solution for the tagging models to generalize on an emerging, resource-scarce domain. In this paper, we propose ESD, an Enhanced Span-based Decomposition method, which follows the metric-based meta-learning paradigm for FSSL. ESD improves previous methods from two perspectives: a) Introducing an optimal span decomposition framework. We formulate FSSL as an optimization problem that seeks for an optimal span matching between test query and supporting instances. During inference, we propose a post-processing algorithm to alleviate false positive labeling by resolving span conflicts. b) Enhancing representation for spans and class prototypes. We refine span representation by inter- and cross-span attention, and obtain the class prototypical representation with multi-instance learning. To avoid the semantic drift when representing the O-type (not a specific entity or slot) prototypes, we divide the O-type spans into three categories according to their boundary information. ESD outperforms previous methods in two popular FSSL benchmarks, FewNERD and SNIPS, and is proven to be more robust in the nested and noisy tagging scenarios.