Industrial components are of high importance because they control critical infrastructures that form the lifeline of modern societies. However, the rapid evolution of industrial components, together with the new paradigm of Industry 4.0, and the new connectivity features that will be introduced by the 5G technology, all increase the likelihood of security incidents. These incidents are caused by the vulnerabilities present in these devices. In addition, although international standards define tasks to assess vulnerabilities, they do not specify any particular method. Having a secure design is important, but is also complex, costly, and an extra factor to manage during the lifespan of the device. This paper presents a model to analyze the known vulnerabilities of industrial components over time. The proposed model is based on two main elements: a directed graph representation of the internal structure of the component, and a set of quantitative metrics that are based on international security standards; such as, the Common Vulnerability Scoring System (CVSS). This model is applied throughout the entire lifespan of a device to track vulnerabilities, identify new requirements, root causes, and test cases. The proposed model also helps to prioritize patching activities. To test its potential, the proposed model is applied to the OpenPLC project. The results show that most of the root causes of these vulnerabilities are related to memory buffer operations and are concentrated in the \textit{libssl} library. Consequently, new requirements and test cases were generated from the obtained data.
翻译:工业组成部分非常重要,因为它们控制了构成现代社会生命线的关键基础设施,然而,工业组成部分的迅速演变,加上工业4.0的新范式,以及5G技术将引入的新的连通性特点,都增加了发生安全事故的可能性。这些事件是这些装置中存在的脆弱性造成的。此外,尽管国际标准界定了评估脆弱性的任务,但没有具体规定任何特定的方法。有一个安全的设计很重要,但也是复杂、昂贵和在装置寿命期间管理的一个额外因素。本文件提供了一个模型,用来分析工业组成部分已知的脆弱性,并随着时间的推移。拟议的模型以两个主要要素为基础:该部件的内部结构的定向图示和一套基于国际安全标准的量化指标;例如,共同脆弱性测算系统(CVSS) 。这一模型适用于一个装置的整个寿命,以跟踪脆弱性,查明新的要求、根源和测试案例。拟议的模型还有助于确定补补活动的优先次序。为测试其潜力,拟议的模型应用到开放点定位中心项目中的两种主要要素:该部件的内部结构,以及一套基于国际安全标准的定量指标;例如,共同脆弱性测算系统。该模型在整个装置的寿命期内应用,这些数据库中产生的数据库中,其最根本原因就是所得出的。