Many granular products have the shape of surface of revolution (SR), typical examples include round pharmaceutical tablets, shelled capsules and M\&M candies. Discrete Element Method (DEM) simulations are often applied to speed up the study of optimized design parameters along with experiments in the particle processing. For this purpose, a novel Surface of Revolution Discrete Element Method (SR-DEM) to simulate granular system with SR particles (i.e. solids of revolution) is developed for this shape family. As surface of revolution is generated by rotating a plane curve around an axis of rotation that lies on the same plane, the shape of any cross section through the axis of rotation remains unchanged because of azimuthal symmetry. Taking advantage of this unique geometry feature, the contact detection and overlap distance evaluation between SR particles can be handled in 2D space for accurate and efficient DEM simulations. In this paper, a node-to-cross-section contact algorithm is proposed to compute the contact force between a pair of SR particles, whereby surface nodes are seeded on the master particle, and cross-section of the slave particle through the axis of rotation is converted into a signed distance field (SDF). Signed distance value of a master node in the slave's cross-section SDF can be used in the contact resolution. The developed SR-DEM code is validated by multiple cases, including particle-wall, particle-particle collisions, static packing of bi-convex tablets and M\&M candies in a cylindrical container, and dynamic angle of repose of these two type of particles in a rotating drum. The numerical results illustrate that the proposed framework is accurate and efficient for the DEM simulation of SR particles.
翻译:许多颗粒产品的外形是革命的表面(SR),典型的例子包括圆状药片、壳状胶囊和M ⁇ M Candies。分辨元素法(DEM)的模拟常常用于加速研究优化设计参数以及粒子处理实验。为此,为这个形状组为这个形状组类开发了新型的革命分解法(SR-DEM)表面,以模拟颗粒(即革命的固体)颗粒颗粒颗粒颗粒颗粒的颗粒系统。随着革命的表面通过在同一平面旋转轴周围旋转一个平面曲线而产生,旋转轴中的任何跨轴的形状由于对齐模量的测量而保持不变。利用这一独特的地理测量特性,可以在 2D 空间对革命颗粒进行接触探测和重叠的距离评价。在本文中,提议一个不偏移到交叉的接触算法算出一组SR粒子之间的接触力,从而在主粒子体的表面节点上播种两个节点的表面节点,任何跨轴的形状的形状的形状的形状的形状的形状的形状,由于对齐形体形体测量测量特征,在SDFEM的深度的内, 的内,可以将一个代粒体的数值的数值转换的数值转换为SDFEM的内,在SDFL的内的一个的内, 。的内, 。