Many multivariate data sets exhibit a form of positive dependence, which can either appear globally between all variables or only locally within particular subgroups. A popular notion of positive dependence that allows for localized positivity is positive association. In this work we introduce the notion of extremal positive association for multivariate extremes from threshold exceedances. Via a sufficient condition for extremal association, we show that extremal association generalizes extremal tree models. For H\"usler--Reiss distributions the sufficient condition permits a parametric description that we call the metric property. As the parameter of a H\"usler--Reiss distribution is a Euclidean distance matrix, the metric property relates to research in electrical network theory and Euclidean geometry. We show that the metric property can be localized with respect to a graph and study surrogate likelihood inference. This gives rise to a two-step estimation procedure for locally metrical H\"usler--Reiss graphical models. The second step allows for a simple dual problem, which is implemented via a gradient descent algorithm. Finally, we demonstrate our results on simulated and real data.
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