Wide field small aperture telescopes (WFSATs) are mainly used to obtain scientific information of point--like and streak--like celestial objects. However, qualities of images obtained by WFSATs are seriously affected by the background noise and variable point spread functions. Developing high speed and high efficiency data processing method is of great importance for further scientific research. In recent years, deep neural networks have been proposed for detection and classification of celestial objects and have shown better performance than classical methods. In this paper, we further extend abilities of the deep neural network based astronomical target detection framework to make it suitable for photometry and astrometry. We add new branches into the deep neural network to obtain types, magnitudes and positions of different celestial objects at the same time. Tested with simulated data, we find that our neural network has better performance in photometry than classical methods. Because photometry and astrometry are regression algorithms, which would obtain high accuracy measurements instead of rough classification results, the accuracy of photometry and astrometry results would be affected by different observation conditions. To solve this problem, we further propose to use reference stars to train our deep neural network with transfer learning strategy when observation conditions change. The photometry framework proposed in this paper could be used as an end--to--end quick data processing framework for WFSATs, which can further increase response speed and scientific outputs of WFSATs.
翻译:远洋广域小孔径望远镜(WFSAT)主要用于获取近似天天天天天体的科学信息,然而,WFSAT获得的图像质量受到背景噪音和可变点分布功能的严重影响。开发高速和高效数据处理方法对进一步科学研究非常重要。近年来,提出了用于探测和分类天体的深神经网络,其性能优于经典方法。在本文中,我们进一步扩展了以天文目标探测框架为基础的深神经网络的能力,使之适合光度和天体测量。我们在深神经网络中添加了新的分支,以同时获取不同天体天体的种类、数量和位置。用模拟数据测试后,我们发现我们的神经网络在光度测量和高效率方法方面表现优于经典方法。由于光度测量和天体测量是回归算法,因此,将获得高精度测量,而光度测量和天体测量结果的准确度将受到不同观测条件的影响。为了解决这一问题,我们进一步提议使用参照恒星来培训深度天文天体天体天体天体天体天体天体天体天体天体天体天体天体天体物体天体测量图的种类、大小和位置位置,同时获取结构结构结构框架在研究中进行快速观测过程中,在学习上进行快速测量图分析分析分析时可转换图分析后再转换图的定位框架。