食品风险残留物快速检测方法研究

项目名称： 食品风险残留物快速检测方法研究

项目编号： No.61471341

项目类型： 面上项目

立项/批准年度： 2015

项目学科： 无线电电子学、电信技术

项目作者： 高晓光

作者单位： 中国科学院电子学研究所

项目金额： 83万元

中文摘要： 离子迁移率谱（IMS）技术因灵敏度高、可靠性好、响应速度快等优点而在痕量物质检测领域得到广泛应用。样品离化是实现IMS检测的前提，电喷雾解吸离化（DESI）技术具有基质耐受性好、样品前处理简单等优点，用于IMS可有效提高检测速度。针对食品中风险残留物检出限低的要求，本项目提出一种基于纳米硅尖阵列的表面增强DESI方法，与IMS联用实现食品风险残留物高灵敏、快速检测。利用MEMS技术制备纳米硅尖阵列作为DESI样品载物表面，实现待测物的高效离化；研究样品载物表面结构及电场分布对DESI离化过程的影响，探索硅尖阵列对DESI的表面增强机理；研究电喷液、电喷辅助气体、IMS漂移气体中微量掺杂剂与待测物的分子-离子反应，选择合适的掺杂剂，实现待测物的高选择性离化。本项目提出的表面增强DESI-IMS联用方法为食品风险残留物的高灵敏、快速检测提供新方法和科学依据。

中文关键词： 气体传感器件；食品风险残留物；快速检测

英文摘要： Ion mobility spectrometry (IMS), which has the advantages of high sensitivity， fast detection and good reliability, has been widely used in detection of trace substance. The formation of gas-phase ions precedes the processes of ion separation and detection of product ions by mobility measurements. Desorption electrospray ionization (DESI) can be coupled with IMS to increase the alalysis speed because DESI can ionize sample with complex matrix directly and needs minimal sample pretreatment. In order to meet the need of low detection limit of undesirable residues in food, a novel method of Substrate-Enhanced DESI based on silicon tip array coupled with IMS is proposed.Silicon tip array fabricated by MEMS technology is used as DESI sample substrate to increase ionization efficiency of undesirable residues in food and the mechanism of Substrate-Enhanced DESI is explored. The ion-neutral interactions of analyte with added solute or dopant is studied and controlled to increase the selectivity of DESI to undesirable residues in food. The proposed novel method of Substrate-Enhanced DESI-IMS provides the scientific basis and a new way to develop the food safety determination method with high sensitivity, short analysis time and good reliability.

英文关键词： gas sensing device;undesirable residues in food;rapid detection