实速测试中低成本的功耗安全测试方法研究

项目名称： 实速测试中低成本的功耗安全测试方法研究

项目编号： No.61204046

项目类型： 青年科学基金项目

立项/批准年度： 2013

项目学科： 信息四处

项目作者： 陈田

作者单位： 合肥工业大学

项目金额： 24万元

中文摘要： 在芯片生产测试中，实速测试是保证时序相关测试质量的关键性技术。但是，实速测试过程中可能产生的高功耗会导致芯片结构损坏、可靠性下降、成品率降低和测试成本增加等问题，因此急需深入研究低成本、功耗安全的实速测试方法。 本项目拟研究：（1）协同优化热相关的测试安全、电源噪声相关的测试安全和测试成本，构建低成本功耗安全的实速测试总体框架；（2）针对线性解压测试环境中特别严重的功耗问题以及优化移位功耗、捕获功耗与测试成本之间的矛盾，研究低成本、功耗安全的X填充策略和测试压缩方法；（3）将成本因素引入功耗度量中，研究"功耗成本度量"模型，以及具有动态调节能力的功耗安全控制方法，并融入芯片的功耗安全可测性设计流程。 本项目拟实现在确保实速测试功耗安全的基础上，对测试成本相关的多种因素协同优化，以促进完善芯片的安全性可测性设计。

中文关键词： 实速测试；测试功耗；低成本；功耗安全；协同优化

英文摘要： At-speed testing is a key technology to guarantee timing-related test quality. However, its applicability is being severely challenged since excessive heat dissipation and power supply noise caused by the high power consumption during at-speed testing process may lead to structural degradation, reduced reliability, yield loss and cost increase. Therefore, at-speed testing methods of low cost and power safety become urgent issues need to be researched. The major contents of this research subject include: (1) Collaboratively optimizing heat-related test power safety, power-supply-noise-related test power safety and test cost, construct a low-cost and power-safe generic framework for at-speed testing. (2) Test power safety has become a serious issue in linear-decompressor-based test data compression environment. A power-safe X-filling technique and test compression methods with low cost should be researched. (3) Introducing cost factors into power metric, research the model of power-cost metric and safety control methods with dynamic regulation, which should be merged into test safety and design-for-testability flow. The research objective of this subject is to ensure power safety across entire test session, collaborate to optimize power consumption and various factors relating to test cost, aiming at improving

英文关键词： at-speed testing；test power；low cost；power safety；collaborative optimization