In the quest of understanding significant variations in the physical, chemical and electronic properties of the novel functional materials, low temperature Synchrotron X-ray Diffraction (LT-SXRD) measurements on CTO (a type-II) and CMTO (a type-I) multiferroics are presented. Magnetic phase diagram of CTO shows multiple magnetic transitions at zero fields, whereas, in CMTO, 20 K enhancement in the antiferromagnetic transition temperature is observed followed by near room temperature Griffiths phase. Rietveld analysis on LT-SXRD data of both the samples indicates important observations. For both CTO and CMTO, the magnetic anomalies are followed by structural anomalies, which is a clear signature of spin lattice coupling and the positive shift of spin lattice coupling from CTO to CMTO.
翻译:为了了解新型功能材料物理、化学和电子特性的重大差异,介绍了CTO(II型)和CMTO(I型)多发温度的低温同步X射线碎片测量(LT-SXRD)和CMTO(I型)多发温度测量。CTO的磁级图显示,零场有多重磁变,而在CMTO中,抗风磁转换温度的20K增强后,在室温接近 Griffiths级时,观察到了20K的抗热磁转换温度增强。对两个样本的LT-SXRD数据进行的Rietveld分析表明了重要的观察结果。CTO和CMTO都显示,磁异常之后有结构异常,这是旋转式螺纹交织的明显标志,是旋转式螺旋交织从CTO向CMTO的积极转变。