Structured illumination microscopy (SIM) is an important super-resolution based microscopy technique that breaks the diffraction limit and enhances optical microscopy systems. With the development of biology and medical engineering, there is a high demand for real-time and robust SIM imaging under extreme low light and short exposure environments. Existing SIM techniques typically require multiple structured illumination frames to produce a high-resolution image. In this paper, we propose a single-frame structured illumination microscopy (SF-SIM) based on deep learning. Our SF-SIM only needs one shot of a structured illumination frame and generates similar results compared with the traditional SIM systems that typically require 15 shots. In our SF-SIM, we propose a noise estimator which can effectively suppress the noise in the image and enable our method to work under the low light and short exposure environment, without the need for stacking multiple frames for non-local denoising. We also design a bandpass attention module that makes our deep network more sensitive to the change of frequency and enhances the imaging quality. Our proposed SF-SIM is almost 14 times faster than traditional SIM methods when achieving similar results. Therefore, our method is significantly valuable for the development of microbiology and medicine.
翻译:结构化光化显微镜是一种重要的超分辨率显微镜技术,它打破了分解限制,加强了光学显微镜系统。随着生物学和医学工程的发展,在极低光度和短期接触环境中对实时和强健的SIM成像的需求很高。现有的SIM技术通常需要多个结构化的光化框架,才能产生高分辨率图像。在本文中,我们提议一个基于深层学习的单一框架结构化显光显微镜(SF-SIM)。我们的SF-SIM只需要一个结构化的照明框架的镜头,并产生与通常需要15发照的传统SIM系统相比类似的结果。在我们的SF-SIM中,我们提出的噪音估计器可以有效地抑制图像中的噪音并使我们的方法能够在低光度和短期接触环境中工作,而不需要堆叠多框架来进行非局部脱色。我们还设计了一个使深层网络对频率变化更加敏感并增强成像质量的波状关注模块。我们提议的SF-SIM方法在传统的医学上几乎比SIM方法更快地达到其价值的14倍。