项目名称: 60GHz及Q波段CMOS功率放大器增益增强与片上功率合成技术研究
项目编号: No.61201044
项目类型: 青年科学基金项目
立项/批准年度: 2013
项目学科: 电子学与信息系统
项目作者: 张博
作者单位: 西安邮电大学
项目金额: 25万元
中文摘要: CMOS毫米波功率放大器的设计,一直受到CMOS工艺在击穿电压及高频增益等方面的制约。由于缺少有效的毫米波功率放大器增益增强与片上功率合成的电路拓扑结构及准确的毫米波MOSFET大信号模型,严重影响了CMOS毫米波功率放大器的性能指标,使其无法满足全球60GHz以及我国Q-LinkPAN标准毫米波短距离通信的需求。本项目围绕毫米波器件参数提取与模型修正、增益增强与片上功率合成技术等设计CMOS毫米波功率放大器的关键问题展开研究,包括(1)研究全网络参数计算的MOSFET毫米波测量去嵌入方法;(2)研究基于LC阻抗调节与3D电磁屏蔽的毫米波功率放大器增益增强技术;(3)基于人工变压器片上功率合成的高输出CMOS毫米波功率放大器。本研究将有效地填补毫米波MOSFET测量去嵌入与大信号模型方面的空白,创新CMOS毫米波功率放大器的设计方法,促进基于CMOS工艺的毫米波高速无线通信技术的快速发展。
中文关键词: CMOS毫米波集成电路;功率放大器;增益增强;片上功率合成;半导体期间测试与建模
英文摘要: The CMOS millimeter-wave power amplifier design is always limited by the breakdown voltage and high frequency gain of CMOS process. Due to shortage of effective gain-boosting technique and on-chip power combining technique for millimeter-wave power amplifier design and accurate millimeter-wave MOSFET large signal model, the performance of CMOS millimeter-wave power amplifier is badly affected, which makes it unable to satisfy the requirement of millimeter-wave short range communication of global 60GHz and our national Q-LinkPAN standard. This project revolves around the key issues of CMOS millimeter-wave power amplifier design, such as parameter extraction of millimeter-wave device and model correction, gain-boosting technique and on-chip power combining technique. The whole research includes: (1) Research on all network parameter calculation based de-embedding method. (2) Research on LC impedance tuning and 3D ground-shielding based millimeter-wave power amplifier gain-boosting technique. (3) Artificial transformer on-chip power combining based high output CMOS millimeter-wave power amplifier. This research will effectively fills the blank of millimeter-wave MOSFET measurement de-embedding and large-signal model and improves the design methodology of CMOS millimeter-wave power amplifier. In addition, it could
英文关键词: CMOS millimeter-wave integrated circuit;power amplifier;gain boosting;on-chip power combing;semiconductor device measurement and modeling