项目名称: 利用XRD-XRF进行铁矿石矿物定量与表征方法的基础研究
项目编号: No.U1460201
项目类型: 联合基金项目
立项/批准年度: 2015
项目学科: 矿业工程
项目作者: 郭兴敏
作者单位: 北京科技大学
项目金额: 200万元
中文摘要: 铁矿石,它是炼铁的一种主要原料,其矿物组成及形态决定着铁矿石的冶金性能,直接影响着生铁产量、质量、能耗乃至CO2排放。特别是,对于年产生铁过七亿吨的大国,更不容忽视。但是,到目前为止还没有一种适宜的矿物定量与表征方法,严重制约了铁矿资源的优化利用以及相关的科学研究。本项目,拟开展X射线衍射(XRD)-X射线荧光(XRF)法对铁矿石矿物定量与表征的研究,建立一种快速、准确的检测方法。作为基础,开展固溶体矿物和玻璃相结构的研究,填补冶金矿物学相关基础数据的不足;在方法上,解决XRD法中存在的择优取向、非晶质影响和重叠衍射峰分离以及XRF法中存在的晶质结构对荧光强度的影响等关键共性问题,提高方法的准确性和普适性;结合Rietveld结构精修和矿物结晶学研究,拓展方法的新功能。相信这项研究,将为优化冶金工艺、深入科学研究奉现出一种强有力技术,同时也会促进冶金矿物学理论发展。
中文关键词: 铁矿石;矿物;定量;表征;X射线衍射与X射线荧光
英文摘要: Iron ore is a main material for ironmaking, in which the mineral composition and morphology determine the metallurgical performances to effect the yield, quality, energy consumption and carbon dioxide emission of ironmaking. Specially, it can be not ignored of a great power country ironmaking over 700 million tons a year. However, until now we have not a proper method to quantify and identify the minerals of iron ore, which restricts seriously the optimal utilization of iron ore and it's science researches. In this project, it is investigated by X-ray diffraction and X-ray fluorescence to establish a method accurate and fast for quantitative and characterization of the minerals in iron ore. As a fundamental study the solid solution and glass phase of the minerals are synthetized and characterized to add a database for minerals of metallurgy. Some key problems are solved on the method as preferred orientation, amorphous effect and separation of overlap peaks exist in XRD, and effect of crystal structure on the intensity exist in XRF to improve accuracy and universality of the method. Moreover, structure refinement of Rietveld and mineral crystallographic researches are combined to expand some new function of the method. This project will be to supply a forceful technology for optimizing the metallurgical process and going deep into the science research, simultaneously promote development of metallurgical mineralogy in the future.
英文关键词: iron ore;minerals;quantitative;characterization;XRD-XRF