Simulation-based fault injection is a widely adopted methodology for assessing circuit vulnerability to Single Event Upsets (SEUs); however, its computational cost grows significantly with circuit complexity. To address this limitation, this work introduces an open-source platform that exploits Spatio-Temporal Graph Neural Networks (STGNNs) to accelerate SEU fault simulation. The platform includes three STGNN architectures incorporating advanced components such as Atrous Spatial Pyramid Pooling (ASPP) and attention mechanisms, thereby improving spatio-temporal feature extraction. In addition, SEU fault simulation datasets are constructed from six open-source circuits with varying levels of complexity, providing a comprehensive benchmark for performance evaluation. The predictive capability of the STGNN models is analyzed and compared on these datasets. Moreover, to further investigate the efficiency of the approach, we evaluate the predictive capability of STGNNs across multiple test cases and discuss their generalization capability. The developed platform and datasets are released as open-source to support reproducibility and further research on https://github.com/luli2021/FsimNNs.
翻译:基于仿真的故障注入是一种广泛采用的方法,用于评估电路对单粒子翻转(SEU)的脆弱性;然而,其计算成本随电路复杂度显著增加。为应对这一限制,本研究引入了一个开源平台,利用时空图神经网络(STGNNs)来加速SEU故障仿真。该平台包含三种STGNN架构,融合了空洞空间金字塔池化(ASPP)和注意力机制等先进组件,从而提升了时空特征提取能力。此外,基于六个不同复杂度的开源电路构建了SEU故障仿真数据集,为性能评估提供了全面的基准。在这些数据集上,对STGNN模型的预测能力进行了分析和比较。进一步地,为深入探究该方法的效率,我们评估了STGNNs在多个测试案例中的预测能力,并讨论了其泛化能力。所开发的平台和数据集已作为开源资源发布,以支持可重复性研究及后续探索,详见 https://github.com/luli2021/FsimNNs。