基于激光偏振跳变的应力测量研究

项目名称： 基于激光偏振跳变的应力测量研究

项目编号： No.61505255

项目类型： 青年科学基金项目

立项/批准年度： 2016

项目学科： 无线电电子学、电信技术

项目作者： 陈文学

作者单位： 中国人民解放军火箭军装备研究院

项目金额： 17万元

中文摘要： 光学元件的微小内应力使其出现双折射现象，影响光学元件的成像质量，应力较大时，会使光学元件发生炸裂，引起事故。为评估光学元件的应力状态，常用的方法是检测光学元件的应力双折射大小。现有的应力双折射检测方法测量精度较低，满足不了应力高精度检测的需求。所以，研究高精度的应力检测技术，特别是能敏感微小应力的检测技术，对于微小应力的检测和高成像质量光学元件的选型，均具有重要意义。本项目针对应力高精度检测的需求，研究激光各向异性回馈偏振跳变的物理机理和偏振跳变点与应力大小的关系，建立应力测量的物理模型，实现对应力大小的高精度检测；研究激光偏振锁定现象的物理本质，基于理论研究结果，提出解除锁定现象的方案，实现对微小内应力大小的高精度检测；研究应力方向变化时激光偏振态的变化规律，基于此规律实现对应力方向的高精度检测。

中文关键词： 光反馈；；激光自混合干涉；；偏振跳变；应力；各向异性

英文摘要： The birefringence induced by the tiny internal stress in optical element influences the imaging quality of optical element. The split of optical element and accident happens when the internal stress in optical elemnt is big. The method of detecting the magnitude of stress birefringence is used to evaluate the stress status of optical element. The existing methods are the qualitative detecting. It is a disadvantage for the discovery and treatment in time. Thus, it is important for the stress detecting and the choose of high quality optical element to research the high precision technology of stress detecting, especially the technology for the tiny stress detecting. Here we studied the physical mechanism of the polarization flipping induced by the anisotropy feedback and the relationship between the position of polarization flipping and the stress magnitude. The physical model for the stress measurement is built. Based on the research results, the high precision detecting for the internal stress is realized. The physical mechanism of polarization locking phenomenon is researched. Based on the theoretical results, the method of releasing polarization locking is proposed and the tiny internal stress is measured. The variation law of the laser polarization states when the stress direction varies is researched. Based on the law, the stress direction is measured.

英文关键词： optical feedback;self-mixing interference;polarization flipping;stress;anisotropy