We present a TCAD compatible multiscale model of phonon-assisted band-to-band tunneling (BTBT) in semiconductors, that incorporates the non-parabolic nature of complex bands within the bandgap of the material. This model is shown capture the measured current-voltage data in silicon, for current transport along the $[100]$, $[110]$ and $[111]$ directions. Our model will be useful to predict band-to-band tunneling phenomena to quantify on and off currents in Tunnel FETs and in small geometry MOSFETs and FINFETs.
翻译:我们提出了一个可兼容的半导体中半无助带带间隧道多尺度模型,其中包括材料带宽内复合带的非抛物性,该模型显示的是硅、目前沿$[100]美元、$[110]美元和$[111]美元方向运输的测量的当前电压数据。我们的模型将有助于预测带间隧道现象,以量化FET隧道、小几何式MOSFET和FINFET中的流流和离流。