项目名称: 具有衬底反型电荷区的硅基横向超结DMOST研究
项目编号: No.61274080
项目类型: 面上项目
立项/批准年度: 2013
项目学科: 无线电电子学、电信技术
项目作者: 成建兵
作者单位: 南京邮电大学
项目金额: 82万元
中文摘要: 针对横向超结DMOST中存在的衬底辅助耗尽效应,本项目提出基于硅基衬底的电场调制型横向超结DMOST新结构。本项目拟在衬底引入反型电荷层,通过提高衬底承担的纵向电压,以降低超结区承担的纵向电压,从而消除衬底辅助耗尽效应。在系统研究新结构存在的体内场调制机理以及寄生效应的基础上,采用解三维泊松方程以及模拟与实验相结合的方法,阐明三维体内场优化机理,建立击穿电压模型、比导通电阻模型以及可靠性相关模型(包含安全工作区、三维温度分布模型和Kirk效应模型)。本项目还将探索包括衬底反型电荷层形成在内的关键工艺技术,提出兼容于标准BCD工艺的新结构工艺流程,制造出600V耐压级高性能的横向超结DMOST新结构,进而设计出单位长度耐压高、比导通电阻低的900V级横向超结功率器件新结构。本项目的立项将为设计电源管理芯片所需高耐压、高可靠性、低成本、低功耗的横向功率器件设计提供思路。
中文关键词: 横向超结DMOST;高低端LDMOST;横向IGBT;选择型埋层;纵向结终端技术
英文摘要: To eliminate the substrate-assisted-depletion effect in the lateral superjunction doubled-diffusion MOSFET (DMOST, SJ-LDMOST), a series of new bulk silicon SJ-LDMOSTs based on electric field modulation are proposed in this project. The new substrate with reversed charges will be used in designing the SJ-LDMOSTs. After detailedly researching on the bulk field modulation and the parasitic effect in the new structures, the 3-dimention mechanism of bulk field modulation will be set forth. Also, the breakdown voltagethe model, the specific on-resistance model and the reliability models (mainly including safe operation area model, 3-dimention temperature distribution model and kirk effect model) will be founded. To fabricate the new structures, key process techniques included forming the reverse-charge-layer will be invented and 600V breakdown-voltage class new structures with high performance will be fabricated. Futhermore, new 900V-class SJ-LDMOTTs with high breakdown voltage per drift region length and low specific on-resistance will be designed. After the project establishment, the substrate-assisted-depletion effect in the novel SJ-LDMOST will be eliminated, which will help to design the lateral power devices featured as high breakdown voltage, high reliabiligy, low cost and low power dissipation for smart power
英文关键词: SJ-LDMOST;High- and Low-side LDMOST;LIGBT;Selective Buried-layer;Vertical Junction Termination Technique