Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.
翻译:嵌入式数字装置,如实地可编程门阵列和芯片系统等,越来越多地用于可靠或安全临界系统,这些商品装置面临显著的硬件老化,这使得长期使用时有可能发生故障,了解老化过程和及早发现硬件退化至关重要,在本次调查中,我们描述了基本老化机制,并审查了发现菲律宾可编程系统、微控制器、索控器和电力供应中老化的主要技术,这项工作的主要目标是通过有组织地介绍所有主要方法,促进这一领域的未来研究工作。