项目名称: 产品测试和BIST环境下数模混合信号集成电路频谱测试与数据处理的理论和算法研究
项目编号: No.61306048
项目类型: 青年科学基金项目
立项/批准年度: 2014
项目学科: 无线电电子学、电信技术
项目作者: 伍民顺
作者单位: 西安交通大学
项目金额: 25万元
中文摘要: 随着系统集成度的增加和工作频率的提高,由于有限的可供访问的内部节点、时钟抖动和信号完整性等因素的影响,传统的方法在测试这些深嵌在SoC内部的混合信号集成电路的频谱性能时已变得异常艰难。本项目旨在解决混合信号集成电路频谱测试所面临的三大挑战:输入信号与采样时钟的非相干性问题、输入信号的削波失真问题和抖动测试问题,并探索出既能适用于产品测试又能适用于内建自测试环境的低成本混合信号集成电路频谱测试方法。产品测试方面,首要目标是降低测试仪器的成本,以使测试过程中可采用便宜的仪器,同时缩短单个被测器件的测试时间;其次是为高性能混合信号集成电路的频谱测试提供切实可行的解决方案,以解决现有的商用仪器无法测试当今高性能混合信号集成电路产品的问题。本项目预期的方法应具有计算高效和易于片上实现的特点,从而为片上频谱测试提供切实可行的解决方案。
中文关键词: 混合信号集成电路;频谱测试;频谱泄漏;抖动测试;非线性信号源
英文摘要: As the integration level of systems increases and the operation frequency becomes higher, due to the limited accessible internal nodes,clock jitter and signal integrity, it becomes extremely challenging to test the spectral performance of the deeply embeded mixed-signal integrated circuits using conventional methods. This project targets at solving the three challenges in the spectral testing of mixed-signal integrated circuits, such as the non-coherency between the input signal and sampling clock, the distortion due to the clipped input signal and jitter testing. The major goal of this project is to develop some cost-effective mixed-signal integrated circuits spectral testing strategies that can be used in both production test and Built-in Self Test (BIST) applications. In the production test applications, the major goal is to reduce the cost of the test equipments so that less expensive equipments can be used and to reduce the testing time of the device under test (DUT). A secondary goal is to provide test solutions for the highest-end parts in which the DUT exceeds the test capabilities of the best available commercial test equipment. The expected theories and algorithms in this project would be computationally efficient and are suitable for on-chip implementation,and hence provide some practical solutions fo
英文关键词: mixed-signal integrated circuits;spectral testing;spectral leakage;jitter testing;nonlinear signal source